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Title

X-RAY SPECTROSCOPY OF PLASMA FOCUS WITH BENT CRYSTAL SPECTROMETER FABRICATION IN LASER RESEARCH CENTER (LRC)

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Abstract

 SPECTROSCOPY OF X-RAY PRODUCED BY PLASMA FOCUS FACILITIES, CAN LEAD TO VALUABLE INFORMATION ABOUT THE PROPERTIES OF THE PINCHED PLASMA. THE IMPORTANT PARAMETERS SUCH AS ELECTRON AND ION TEMPERATURE, DENSITY IN THE ELECTRIC AND MAGNETIC FIELDS IN PLASMA CAN BE DETERMINED THROUGH THIS KIND OF SPECTROSCOPY. IN THIS ARTICLE, A NEW METHOD FOR X-RAY SPECTROSCOPY, WITHIN THE ENERGY RANGE OF 0.7-2.5 KEV, OF THE RADIATION FROM “DENA” PLASMA FOCUS IS PRESENTED. IT SHOULD ALSO BE MENTIONED THAT THIS NEW SYSTEM IS BASED ON A CURVED, CYLINDRICAL CRYSTAL MADE OF MIKA.

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