Paper Information

Title: 

INVESTIGATING THE SURFACE TOPOGRAPHY VIA SEM IMAGES BASED ON FRACTAL AND MULTIFRACTAL THEORY

Type: PAPER
Author(s): SEDDIGH FERESHTE,MOJTAHEDZADEH LARIJANI MAJID,JAFARI KHAMSE ELHAM,KHANLARI MOHAMMADREZA,ESHGHI SIMA
 
 
 
Name of Seminar: NATIONAL VACUUM CONFERENCE IRAN
Type of Seminar:  CONFERENCE
Sponsor:  PAZHOHESHKADE OLOM VA SANAYE GHAZAEE
Date:  2012Volume 5
 
 
Abstract: 

SILVER THIN FILMS WERE DEPOSITED BY ION BEAM SPUTTERING TECHNIQUE IN THE RANGE OF 100-400OC SUBSTRATE TEMPERATURE. THE SURFACE TOPOGRAPHY OF THE FILMS WAS CHARACTERIZED USING SCANNING ELECTRON MICROSCOPY (SEM). MEANWHILE, THE FRACTAL THEORY HAS BEEN USED FOR THE TREATMENT OF SURFACE ROUGHNESS. DIFFERENTIAL BOX COUNTING METHOD WAS USED FOR CALCULATION OF FRACTAL DIMENSION AND MULTIFRACTAL PARAMETERS OF THE FILMS. IN ORDER TO IMPROVE VISUALIZE CHARACTERISTICS OF THE IMAGES BOTH 2D AND 3D SEM IMAGES WERE USED.

 
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