Paper Information

Title: 

CALCULATE OF THICKNESS AND REFRACTIVE INDEX OF HFO2 THIN FILM BY USING TRANSMISSION SPECTRA

Type: PAPER
Author(s): GHESHLAGHI MARYAM,BOHLOL NOSHIN,HOJATIRAD HASHEM,MALEKI HADI
 
 
 
Name of Seminar: NATIONAL VACUUM CONFERENCE IRAN
Type of Seminar:  CONFERENCE
Sponsor:  ANJOMANE KHALA IRAN-DANESHGAHE SHAHID BEHESHTI AHVAZ
Date:  2014Volume 6
 
 
Abstract: 

CALCULATE THE REFRACTIVE INDEX AND THICKNESS OF THIN FILM DEPOSITION IS AN INTERESTING DISCUSSION ON THE SUBJECT. IN THIS PAPER, HFO2 THIN FILM WAS DEPOSITED BY BALZERS MACHINE COATING BAK510, WITH PHYSICAL VAPOR DEPOSITION METHOD. THEN IT PASSES THROUGH THE SPECTRUM IN THE RANGE OF UV-VIS-NIR SPECTROMETER CARY500 OBTAINED.
FINALLY, USING THE METHOD OF TRANSMISSION SPECTRA ENVELOP, REFRACTIVE INDEX OF THIN HFO2 LAYERS WAS CALCULATED AS A FUNCTION OF WAVELENGTH. THEN THIN FILM THICKNESS WAS DETERMINED THAT MEASURING THE AMOUNT SHOWN BY THE THICKNESS MONITORING OF COATING MACHINE IS THE SAME.

 
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