Paper Information

Title: 

X-RAY SPECTROSCOPY OF PLASMA FOCUS WITH BENT CRYSTAL SPECTROMETER FABRICATION IN LASER RESEARCH CENTER (LRC)

Type: PAPER
Author(s): MALEKI M.HADI,TAFRESHI A.MOHAMMAD,AMROLLAHI REZA,ABBASI S.PEYMAN
 
 
 
Name of Seminar: IRAN PHYSICS CONFERENCE
Type of Seminar:  CONFERENCE
Sponsor:  PHYSICS SOCIETY OF IRAN
Date:  2005Volume -
 
 
Abstract: 

SPECTROSCOPY OF X-RAY PRODUCED BY PLASMA FOCUS FACILITIES, CAN LEAD TO VALUABLE INFORMATION ABOUT THE PROPERTIES OF THE PINCHED PLASMA. THE IMPORTANT PARAMETERS SUCH AS ELECTRON AND ION TEMPERATURE, DENSITY IN THE ELECTRIC AND MAGNETIC FIELDS IN PLASMA CAN BE DETERMINED THROUGH THIS KIND OF SPECTROSCOPY. IN THIS ARTICLE, A NEW METHOD FOR X-RAY SPECTROSCOPY, WITHIN THE ENERGY RANGE OF 0.7-2.5 KEV, OF THE RADIATION FROM “DENA” PLASMA FOCUS IS PRESENTED. IT SHOULD ALSO BE MENTIONED THAT THIS NEW SYSTEM IS BASED ON A CURVED, CYLINDRICAL CRYSTAL MADE OF MIKA.

 
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