Paper Information

Title: 

A COMBINED METHOD TO IMPROVE SEQUENTIAL CIRCUIT TEST GENERATION

Type: PAPER
Author(s): MOHAMMADKHANI ROOHOLLAH,HESSABI SHAAHIN*
 
 *DEPARTMENT OF COMPUTER ENGINEERING, SHARIF UNIVERSITY OF TECHNOLOGY TEHRAN, IRAN
 
Name of Seminar: CONFRANCE SALANE ANJOMANE COMPUTER IRAN
Type of Seminar:  CONFERENCE
Sponsor:  Anjomane Computer Iran
Date:  2004Volume 9
 
 
Abstract: 

THIS PAPER PROPOSES A COMBINED METHOD FOR SEQUENTIAL CIRCUIT TEST GENERATION WHICH EMPLOYS STGBASED AND GA-BASED TEST GENERATION TECHNIQUES. ALMOST ALL PREVIOUS HYBRID TEST GENERATORS USE ALGORITHMIC DECOMPOSITION, BUT THE PROPOSED METHOD USES CIRCUIT DECOMPOSITION. SO THE STG-BASED TECHNIQUES ARE USED TO GENERATE TEST FOR CONTROL UNIT AND TEST GENERATION FOR DATAPATH UNIT IS PERFORMED BY RESORTING TO GA-BASED TECHNIQUES. THE COMBINATION OF THE TWO TECHNIQUES IS EXPECTED TO PROVIDE HIGH FAULT COVERAGES IN A REASONABLE TIME. EXPERIMENTAL RESULTS SHOW THE EFFECTIVENESS OF THE APPROACH.

 
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