Click for new scientific resources and news about Corona[COVID-19]

Paper Information

Journal:   JOURNAL OF SPACE SCIENCE AND TECHNOLOGY (JSST)   SPRING 2009 , Volume 2 , Number 3; Page(s) 35 To 42.
 
Paper: 

A RELIABILITY GROWTH MODEL FOR A LAUNCH VEHICLE WITH ITS REQUIREMENTS

 
 
Author(s):  MEHRAFROZ Z.*, RADPOUR S.
 
* SCHOOL OF INDUSTRIAL ENG. ELECTRICAL ENG. DEPT., IRAN UNIV. OF SCIENCE AND TECH. (IUST), AVE. FARJAM, NARMAK, TEHRAN
 
Abstract: 

In this paper, reliability growth concepts and modeling methods have been studied and a reliability growth model for launch vehicles has been proposed. Numerical example shows how we can obtain the model parameters. A method for calculating the initial launch vehicle reliability is suggested, also a method for estimating and validating of launch vehicle reliability in various number of launches with number of successes based on binomial distribution has been proposed. Results show after 10 successful launches we can conclude that launch vehicle reliability is between 0.741 and 1.

 
Keyword(s): RELIABILITY GROWTH, LAUNCH VEHICLE, LAUNCH VEHICLE RELIABILITY
 
 
References: 
  • Not Registered.
  •  
  •  
 
Citations: 
  • Not Registered.
 
+ Click to Cite.
APA: Copy

MEHRAFROZ, Z., & RADPOUR, S. (2009). A RELIABILITY GROWTH MODEL FOR A LAUNCH VEHICLE WITH ITS REQUIREMENTS. JOURNAL OF SPACE SCIENCE AND TECHNOLOGY (JSST), 2(3), 35-42. https://www.sid.ir/en/journal/ViewPaper.aspx?id=274979



Vancouver: Copy

MEHRAFROZ Z., RADPOUR S.. A RELIABILITY GROWTH MODEL FOR A LAUNCH VEHICLE WITH ITS REQUIREMENTS. JOURNAL OF SPACE SCIENCE AND TECHNOLOGY (JSST). 2009 [cited 2021July25];2(3):35-42. Available from: https://www.sid.ir/en/journal/ViewPaper.aspx?id=274979



IEEE: Copy

MEHRAFROZ, Z., RADPOUR, S., 2009. A RELIABILITY GROWTH MODEL FOR A LAUNCH VEHICLE WITH ITS REQUIREMENTS. JOURNAL OF SPACE SCIENCE AND TECHNOLOGY (JSST), [online] 2(3), pp.35-42. Available: https://www.sid.ir/en/journal/ViewPaper.aspx?id=274979.



 
 
Persian Abstract Yearly Visit 49
 
 
Latest on Blog
Enter SID Blog