Paper Information

Journal:   JOURNAL OF THEORETICAL AND APPLIED PHYSICS (IRANIAN PHYSICAL JOURNAL)   SEPTEMBER 2010 , Volume 4 , Number 2; Page(s) 30 To 33.
 
Paper: 

MEASUREMENT OF THICKNESS AND ELECTROPHYSICAL PARAMETERS OF DIELECTRIC AND METALIC THIN FILMS BY OPTICAL AND MICROWAVE METHODS

 
 
Author(s):  USANOV D.A., SKRIPAL AL.V., SKRIPAL AN.V., ABRAMOV A.V., BOGOLUBOV A.S., BAKOUIE A.*
 
* DEPARTMENT OF PHYSICS, SCIENCE FACULTY, MOHAGHEGH ARDABILI UNIVERSITY, ARDABIL, IRAN
 
Abstract: 
The possibility to determine the thickness and electrophysical parameters of thin dielectric and metal films in sandwich- like structures using the results of measurement of reflection and transmission spectra in microwave and optical band are shown. The results of measurement of refractive index of SnO2 in the thickness range of 40 nm to 2800 nm and the results of measurement of conductivity of Cr-films applied to ceramic substrates are presented.
 
Keyword(s): ELECTROPHYSICAL PARAMETERS, MICROWAVE, DIELECTRIC FILMS, CONDUCTIVITY, OPTICAL METHOD
 
References: 
  • ندارد
 
  pdf-File tarjomyar Yearly Visit 88
 
Latest on Blog
Enter SID Blog