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Paper Information

Journal:   IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING   2019 , Volume 14 , Number 38 ; Page(s) 43 To 51.
 
Paper: 

Effect Of Concentration And Thickness Of Aluminum Contamination On The Properties Of Structural, Optical And Electrical Of Tin Oxide (Sno2)Thin Films Doped With Aluminum

 
 
Author(s):  Azarvand Hassan Fard Bahare*, Ebrahimi Ardei Khadijeh
 
* Department of Physics, Payame Noor University (PNU), 19395-3697, Iran
 
Abstract: 
In this experimental work Al doped tin oxide thin films with different composition of 5 to 10 mass percent of Al and 95 to 90 mass percent of SnO2 were deposited on glass substrates by electron beam evaporation technique. Then effects Al and thickness on the electrical, optical and structural properties of thin films were investigated. Properties of thin films have been studied using X-ray diffraction, UV-Visible spectrophotometer and four probe methods. XRD photographs were prepared and show the polycrystalline structure formation and preferred orientation (110). Also by increasing films thickness, optical transmission and resistivity are decreased. So that in the case of the films with 7. 5 mass percent of Al, the average transmission decreases from 88. 5 % for film with a thickness of 250 nanometer to 82. 3 % for film with a thickness of 450 nanometer and resistivity reaches to its minimum value of 5. 247×10-4   cm for the sample with a thickness of 450 nm.
 
Keyword(s): thin films,Al doped tin oxide,X-ray diffraction,optical transmission,resistivity
 
 
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APA: Copy

Azarvand Hassan Fard, B., & Ebrahimi Ardei, K. (2019). Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, 14(38 ), 43-51. https://www.sid.ir/en/journal/ViewPaper.aspx?id=828200



Vancouver: Copy

Azarvand Hassan Fard Bahare, Ebrahimi Ardei Khadijeh. Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING. 2019 [cited 2022January29];14(38 ):43-51. Available from: https://www.sid.ir/en/journal/ViewPaper.aspx?id=828200



IEEE: Copy

Azarvand Hassan Fard, B., Ebrahimi Ardei, K., 2019. Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, [online] 14(38 ), pp.43-51. Available: https://www.sid.ir/en/journal/ViewPaper.aspx?id=828200.



 
 
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